Abstracts and may be viewed here or navigated by clicking on the titles below. The program is still being updated so keep checking back for updates!

At-a-Glance Schedule – Thursday, September 26

8:00a – 9:00a

Welcome & Plenary Session (Green Auditorium)

Green Auditorium

Portrait Room

Heritage Room

9:15a – 10:00a

1A: The Spike Interaction 
James M. Lucas, J. M. Lucas and Associates

Moderator: TBD

1B: Constructing a Space-Filling Mixture Experiment Design to Augment Existing Points Over a Region Specified by Linear and Nonlinear Constraints
Greg Piepel, Pacific Northwest National Laboratory

Moderator: TBD

1C: Statistical Process Control: Myths, Misconceptions, and Applications
Daksha Chokshi, Aerojet Rocketdyne

Moderator: TBD

10:30a – 12:00p

2A: STAT Invited Session

Time to Say Goodbye to Statistical Significance

Ron Wasserstein, Executive Director, ASA
Allen Schirm, Mathematica Policy Research (retired)

Moderator: TBD

2B: Applications

TBD

Moderator: TBD

2C: Technometrics
Invited Session

A Hierarchical Model for Heterogeneous Reliability Field Data

William Meeker, Iowa State Univ.

Optimal Experimental Design in the Presence of Nested Factors 
Bradley Jones, JMP

Moderator: TBD

12:15p – 1:45p Luncheon:

Reliability of Eyewitness Identification as a Forensic Tool
Karen Kafadar, ASA President, Dept. of Statistics, University of Virginia

2:00p – 3:30p

3A: DOE

Utilizing the Structure of Two-Level Designs for Design Choice and Analysis
David Edwards, Virginia Commonwealth Univ.

OMARS Designs: Bridging the Gap between Definitive Screening Designs and Standard Response Surface Designs
Peter Goos, KU Leuven


Moderator:
TBD

3B: Quality

Laplace-Beltrami Spectra as a Tool for Statistical Shape Analysis of 2-D Manifold Data
Xueqi Zhao, Penn. State Univ.

TBD

Moderator: TBD

3C: Additive Manufacturing

Translating Images to Information: Improving Process Evaluation and Control Systems for Additive Manufacturing
Mindy Hotchkiss, Aerojet Rockeydyne
Sean Donegan, Air Force Research Laboratory

Experiment Planning and Additive Manufacturing Process Development
Leslie M. Moore, Sandia

Moderator: TBD

4:00p – 5:00p

W. J. Youden Address (Green Auditorium)

Jim Filliben, NIST

 

At-a-Glance Schedule – Friday, September 27

Green Auditorium

Portrait Room Heritage Room
8:00a – 9:30a

4A: Q&P Invited Session

TBD

TBD


Moderator: TBD

4B: CPID Invited Session

Lower Confidence Limits for Series System Reliability

Allan McQuarrie, Johns Hopkins Univ. Applied Physics Laboratory

TBD

Major Jason Freels, Air Force Institute of Technology

Moderator: TBD

4C: Journal of Quality Technology Invited Session

A Bayesian Hierarchical Model for Quantitative and Qualitative Responses
Xinwei Deng, Virginia Tech

Spatially Weighted PCA for Monitoring Video Image Data with Application to Additive Manufacturing
Marco Grasso, Politecnico di Milano

Moderator: TBD

10:00a – 11:30a

5A: SPES Invited Session

Functional Analysis in Chemical Process
Flor Castillo, SABIC

 

Iterative Modeling with Functional Data
Joanne Wendelberger, LANL

Moderator: TBD

5B: Machine Learning

Active Learning for Gaussian Process considering Uncertainties with Application to Shape Control of Composite Fuselage
Xiaowei Yue, Virginia Tech

Predictive Comparisons for Screening and Interpreting Inputs in Machine Learning
Arman Sabbaghi, Purdue Univ.

Moderator: TBD

5C: Quality Engineering Invited Session

Rethinking Control Chart Design and Evaluation
William H. Woodall, Virginia Tech

Statistical Reasoning in Diagnostic Problem Solving — The Case of Flow-Rate Measurements
Jeroen De Mast, Univ. Waterloo

Moderator: TBD

11:45a-1:15p

Luncheon:

John Butler, NIST

1:30p – 3:00p

6A: DOE/Binary Data

Practical Considerations in the Design of Experiments for Binary Data
Martin Bezener, Stat-Ease

Separation in D-optimal Experimental Designs for the Logistic Regression Model
Anson Park, Arizona State Univ.

Moderator: TBD

6B: Model Calibration

On-site Surrogates for Large-scale Calibration
Jiangeng Huang, Virginia Tech

TBD

Moderator: TBD

6C: Industrial Processes

Poisson Count Estimation
Michaela Brydon, Kenyon College

Monitoring Within and Between Non-Linear Profiles Using a Gaussian Process Model with Heteroscedasticity
A. Valeria Quevedo, Universidad de Piura

Moderator: TBD

3:15p – 5:15p

Reception, followed by SPES Special Session:

Training the Next Generation of Statisticians: What do They Need to Know?
Panelists: Will Guthrie, NIST; Richard Warr, BYU; Ruth Hummel, JMP; and TBD

Moderator: TBD

View past programs here.